Advantest Debuts Two New Advantest Cloud Solutions to Boost Production Efficiencies for New IC Designs

Leveraging the core technology developed by PDF Solutions, the data generated from customer workflows is used to provide feedback on processes from semiconductor design validation to manufacturing, chip test, and system-level test. Customers can get more value out of their supply chain, their equipment, and their test data, to achieve faster time-to-yield with higher overall equipment efficiency by using advanced algorithms, integrated workflows, and methodologies delivered through Advantest Cloud Solutions.

Advances in semiconductor technology such as advanced process nodes, electrical scaling, 2.5D, and 3D packaging, and a new focus on systems present unique challenges that can only be solved through comprehensive software-guided solutions. Integrating traditional data silos throughout the semiconductor value chain can significantly improve product quality, manufacturing yield, and cost efficiencies.

The Advantest V93000 Dynamic Parametric Test system powered by PDF Exensio^® DPT, jointly developed by Advantest and PDF Solutions, adds rule-based, intelligent test flow adaptation to the V93000 SMU8 parametric test platform. With this technology, test flows are automatically optimized on-the-fly within milli-seconds to increase die test coverage, improve the characterization of aberrant measurements, correct equipment issues, and streamline the collection of additional data to support root-cause identification and down-stream analytics.

The new ACS edge HPC product can run complex test workloads with millisecond latencies and is available for early adopters. With pre-configured containers for machine learning (ML), demodulation, or other high-performance workloads, the system makes it easy to implement ML in semiconductor test. Besides allowing users to track, manage, and secure all containers from the cloud, it also provides on-demand access to previous insertion data through application programming interfaces (APIs) with built-in forward and backward data feeds. Customers can deploy machine learning models and algorithms in production, perform in-situ test flow optimizations, and remotely manage highly sensitive IP with maximum security.

“Just as we deliver value to our customers by offering the most advanced test technologies, Advantest is continually working to pioneer new business practices and expand our product portfolio with fast-response, cost-saving services from the cloud,” said Doug Lefever, president and CEO of Advantest America Inc. “We view such innovations as part of our Grand Design objective to add value throughout the entire semiconductor value chain.”

These ACS products and other services are now available.

About PDF SolutionsAs a leader in advanced data analytics, machine learning, and equipment connectivity, PDF Solutions provides a comprehensive end-to-end platform for smart manufacturing connectivity, data collection and management, and machine-learning analytics for the semiconductor and electronics ecosystem, enabling companies to improve yield, quality, and reliability across the entire product lifecycle. Organizations of all sizes around the world rely on the Exensio® and Cimetrix® platforms to connect, collect, monitor and analyze data at any scale to drive efficient and profitable high-volume manufacturing. Headquartered in Santa Clara, California, PDF Solutions also operates worldwide in Canada, China, France, Germany, Italy, Japan, Korea, Singapore and Taiwan. For the Company’s latest news and information, visit http://www.pdf.com  

PDF Solutions and Exensio are trademarks or registered trademarks of PDF Solutions, Inc. and/or its subsidiaries in the U.S. and other countries.