• Firmenintern

    Advantest Acquires Shin Puu

    Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) announced today that it entered into an agreement to acquire Taiwan-based Shin Puu Technology Co., Ltd. ("Shin Puu”). Shin Puu, which has 264 employees and 16,913㎡ total floor area of production space, is a supplier of printed circuit boards (PCBs) that manufactures and assembles PCBs, key components used in electronics, in Taiwan, a global hub of the electronics industry. Advantest acquired US-based R&D Altanova, a leading supplier of consumable test interface boards, substrates and interconnects for high-end applications, in 2021. By combining R&D Altanova’s high-performance, high-density PCB design technology with Shin Puu’s manufacturing capabilities, the company will expand its manufacturing footprint…

  • Elektrotechnik

    Advantest to Showcase Latest Semiconductor Test Solutions at SEMICON Korea, February 1-3 in Seoul

    Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature its latest test solutions for advanced ICs at the SEMICON Korea on Feb. 1-3 at COEX in Seoul, South Korea. Advantest will highlight its contributions to leading-edge test technology, including advanced memory, 5G, AI, high-performance computing (HPC) and nanotechnology, as well as its ESG initiatives. Exhibition Advantest’s product showcase in booth #C510 will feature how the company is adding customer value to the evolving semiconductor value chain through its broad range of test solutions and services. This year’s digital displays will include: New inteXcell, first-ever fully integrated and unified test infrastructure to combine the T5835 tester into minimal-footprint test…

    Kommentare deaktiviert für Advantest to Showcase Latest Semiconductor Test Solutions at SEMICON Korea, February 1-3 in Seoul
  • Elektrotechnik

    Advantest Opens Registration for International VOICE 2023 Developer Conference, May 9-10

    Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has begun accepting registration from semiconductor test professionals around the world to participate in its VOICE 2023 Developer Conference, held on May 9-10, in Santa Clara, California. Under the theme “Beyond the Technology Horizon,” this year’s conference welcomes the international community of users and strategic partners involved with Advantest’s V93000 and T2000 SoC test platforms, as well as its system-level test solutions, handlers, test cell and cloud solutions. The VOICE 2023 program features extensive opportunities for attendees to learn, including more than 80 presentations organized across nine topical tracks, a Technology Kiosk Showcase featuring the latest test solutions through live presentations…

    Kommentare deaktiviert für Advantest Opens Registration for International VOICE 2023 Developer Conference, May 9-10
  • Elektrotechnik

    Advantest Selected for the First Time for DJSI Asia Pacific

    Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) announced that it has been selected for the first time as a constituent stock of the Dow Jones Sustainability Asian Pacific Index (DJSI Asia Pacific), which is operated by S&P Dow Jones Indices in the United States.  The Dow Jones Sustainability Indices (DJSI) are composed of companies selected for their excellent sustainability performance on both general and industry-specific criteria. Since their launch in 1999, the DJSI has been recognized worldwide as an important indicator of corporate sustainability performance. 156 companies from the Asia Pacific region were selected for DJSI Asia Pacific in 2022, including 74 Japanese companies, one of which is…

  • Elektrotechnik

    Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects

    Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today unveiled the E5620 Defect Review Scanning Electron Microscope (DR-SEM), its newest mask SEM product for reviewing and classifying ultra-small defects on photomasks and mask blanks. With its high-accuracy, high-throughput defect review capability, the E5620 DR-SEM is expected to contribute appreciably to production quality improvements in next-generation photomasks and shorter mask manufacturing turnaround times. Like its predecessor, the E5620 implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. The system has a number of improvements specifically to target future mask requirements. “In working with our customers to determine…

    Kommentare deaktiviert für Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects
  • Elektrotechnik

    Advantest Introduces New inteXcell Series of High-Performance, Economical Test Cells for Advanced Memory ICs

    Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has launched inteXcell, a new line of minimal-footprint test cells designed to address demanding final-test requirements presented by the increasing bit densities, lower power consumption and faster interface speeds of future memory devices. This new final test cell infrastructure integrates a T5835 memory tester optimized for use in high-productivity test cells and is designed to adopt future memory solutions. With inteXcell, ICs can be tested on the same platform from initial engineering through mass production. inteXcell is the first ever fully integrated and unified test solution to combine broad test coverage with high-throughput handling in a highly flexible system architecture. Early…

    Kommentare deaktiviert für Advantest Introduces New inteXcell Series of High-Performance, Economical Test Cells for Advanced Memory ICs
  • Elektrotechnik

    Advantest Launches Unique AI-Powered Software Solution to Accelerate Yield Improvement Throughout IC Engineering and Production

    Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) is offering a new yield-improvement solution that leverages artificial intelligence (AI) to expedite identifying the root causes of yield loss and increasing the efficiency of analyzing test results. The innovative and scalable Advantest Cloud Solutions Engineering AI Studio for Yield Improvement (ACS EASYTM) can increase the productivity of both device engineering and production operations for a wide range of users, from chip designers to outsourced semiconductor assembly and test (OSAT) companies. Device yields are key performance indicators in semiconductor production, requiring continuous engineering efforts to debug and fine-tune. The unique ACS EASY application uses AI to automatically monitor test conditions and…

    Kommentare deaktiviert für Advantest Launches Unique AI-Powered Software Solution to Accelerate Yield Improvement Throughout IC Engineering and Production
  • Elektrotechnik

    Advantest Showcases Latest Semiconductor Test Solutions at SEMICON Europa 2022

    Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will showcase their diverse portfolio of test solutions at SEMICON Europa, on November 15-18 in Munich, Germany. At booth #C1.301 in Hall C1, Advantest will display its newest IC test solutions that provide overall value and lower costs while optimizing yields during the testing process. This year’s exhibit includes: Test solutions for an expanded range of devices (performance logic, mixed signal, power and wireless devices) with V93000 EXA Scale™ SoC Test System Highest density instrumentation to meet test demands in the age of convergence Flexible instrumentation offering highest density resources Extended Power Supply (XPS) – XPS128+HV developed to lower the cost…

    Kommentare deaktiviert für Advantest Showcases Latest Semiconductor Test Solutions at SEMICON Europa 2022
  • Hardware

    Advantest führt universelle VI- und Stromversorgungskarte für das V93000 EXA Scale SoC Test System ein

    Advantest Corporation (TSE: 6857), führender Anbieter von Halbleitertestsystemen, hat die DC Scale XPS128+HV als Erweiterung seiner Power Supply (XPS)-Kartenserie vorgestellt. Dieses universelle Spannungs-Strom (VI)-Instrument kombiniert eine hohe Kanalanzahl (128 Kanäle pro Karte) mit Spannungsbereichen von bis zu +24V pro Quelle. Damit werden die Testanforderungen für Hochspannungs-ICs wie USB Power Delivery Komponenten und Ladefunktionen in Power-Management-ICs (PMICs) effizient erfüllt. Zur bereits im Markt erfolgreich etablierten XPS256-Karte bietet die XPS128+HV volle Kanalkompatibilität. Sie  ermöglicht effiziente, hochparallele Tests von Power-Management-ICs mit erweiterter Leistungsfähigkeit für Hochspannungsanwendungen, während sie gleichzeitig bestehende Anwendungen im Niederspannungsbereich abdeckt. Das neue Modul erfüllt die Anforderungen an ein kosteneffizientes ATE-System mit vielen Power-VI-Kanälen und großer Pin-Anzahl. "Unsere Kunden fragen zunehmend…

    Kommentare deaktiviert für Advantest führt universelle VI- und Stromversorgungskarte für das V93000 EXA Scale SoC Test System ein
  • Elektrotechnik

    Advantest Launches Universal VI and Power Supply Card for V93000 EXA Scale SoC Test System

    Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the latest addition to its Extended Power Supply (XPS) card series: the DC Scale XPS128+HV. This universal voltage-current (VI) instrument combines a high channel count (128 channels per card) with per-channel voltage ranges of up to +24V creating a test solution that efficiently addresses the test requirements for high-voltage devices such as USB Power Delivery components and charger functionalities in power management ICs (PMICs). The XPS128+HV provides full channel compatibility with the existing XPS256 card, enabling efficient, highly parallel test of power management devices with enhanced capability for high-voltage applications while continuing to cover existing applications in the low-voltage…

    Kommentare deaktiviert für Advantest Launches Universal VI and Power Supply Card for V93000 EXA Scale SoC Test System